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Atomic-force microscopy
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181	Hi-tech INDUSTRIAL FLAW DETECTION AND NON-DESTRUCTIVE DIAGNOSTIC: A NEW APPROACH Viktor BYKOV, General Director, JSC NTI Add to Reading List Source URL: www.ntmdt.com Language: English - Date: 2011-05-12 08:56:19 Scanning probe microscopy Microscopy Intermolecular forces Materials science Atomic force microscopy Nanotechnology Microscope Optical microscope Electron microscope Science Scientific method Chemistry
182	Application Note 088 High-Resolution Imaging in Different Atomic Force Microscopy Modes John Alexander and Sergei Magonov NT-MDT Development Inc. Tempe AZ USA Add to Reading List Source URL: www.ntmdt.ru Language: English - Date: 2015-03-16 02:50:10 Chemistry Atomic force microscopy Microscopy Scanning tunneling microscope Microscope Vibrational analysis with scanning probe microscopy Magnetic force microscope Scanning probe microscopy Science Scientific method
183	High-Resolution Imaging in Different Atomic Force Microscopy Modes John Alexander and Sergei Magonov NT-MDT Development Inc. Tempe AZ USA • A n operation of AFM microscope in a temperaturestable cabinet facilitates Add to Reading List Source URL: ntmdt.com Language: English - Date: 2015-03-16 03:01:49 Chemistry Atomic force microscopy Microscopy Scanning tunneling microscope Microscope Vibrational analysis with scanning probe microscopy Magnetic force microscope Scanning probe microscopy Science Scientific method
184	A revolutionary step in AFM design Revolution Cartridge for Multi-probe Cartridges. Enables Automated Cantilever Replacement with Full Tuning. Standard AFM Head for traditional single chip probes for traditional AFM ca Add to Reading List Source URL: www.ntmdt.com Language: English - Date: 2014-05-19 02:29:27 Scientific method Kelvin probe force microscope Magnetic force microscope Microscopy Scanning tunneling microscope Cantilever Atomic force microscopy Nanosensors Scanning probe microscopy Science Chemistry
185	Surfactant micelles in aqueous solution: critical resolution in AFM It’s a widely spread idea that performing AFM in liquids is a rather complicated research approach. Actually, many tasks related to the investigation Add to Reading List Source URL: www.ntmdt.com Language: English - Date: 2009-08-18 06:09:11 Scanning probe microscopy Nanotechnology Micelle Supramolecular chemistry Cetrimonium bromide Surfactant AFM probe Atomic force microscopy NanoWorld Chemistry Science Colloidal chemistry
186	Characterization of Materials with a Combined AFM/ Raman Microscope Marko Surtchev1, Sergei Magonov1 and Mark Wall2 1 NT-MDT America, Tempe, AZ U.S.A. 2 Add to Reading List Source URL: ntmdt.com Language: English - Date: 2015-02-19 03:40:30 Scanning probe microscopy Spectroscopy Microscopy Intermolecular forces Raman spectroscopy Laboratory techniques Chemical imaging Raman scattering Atomic force microscopy Scientific method Science Chemistry
187	Flexible integrated research AFM OPEN is a fully automated desktop AFM. It is much more than just topography imaging tool. Coupled with PX Ultra controller, the OPEN provides the largest suite of AFM measuring techniqu Add to Reading List Source URL: ntmdt.com Language: English - Date: 2012-12-28 07:31:35 Chemistry Magnetic force microscope Microscopy Microscope Kelvin probe force microscope Atomic force microscopy Photoconductive atomic force microscopy Scanning probe microscopy Science Scientific method
188	ISSN 10637826, Semiconductors, 2014, Vol. 48, No. 13, pp. 1757–1762. © Pleiades Publishing, Ltd., 2014. Original Russian Text © V.I. Avilov, O.A. Ageev, A.S. Kolomiitsev, B.G. Konoplev, V.A. Smirnov, O.G. Tsukanova, Add to Reading List Source URL: www.ntmdt.com Language: English - Date: 2015-01-21 05:36:16 Scanning probe microscopy Technology Electrical components Memristor Titanium dioxide Titanium Local oxidation nanolithography Atomic force microscopy Resistive random-access memory Chemistry Emerging technologies Matter
189	Flexible integrated research AFM OPEN is a fully automated desktop AFM. It is much more than just topography imaging tool. Coupled with PX Ultra controller, the OPEN provides the largest suite of AFM measuring techniqu Add to Reading List Source URL: www.ntmdt.com Language: English - Date: 2012-12-28 07:31:35 Chemistry Magnetic force microscope Microscopy Microscope Kelvin probe force microscope Atomic force microscopy Photoconductive atomic force microscopy Scanning probe microscopy Science Scientific method
190	In depth... Comparative Atomic Force Microscopy Study of Soft Materials in the Hybrid and Amplitude Modulation Modes I. Malovichko1, S. Leesment1, J. Alexander2, S. Belikov2, C. Wall2, I. Yermolenko2, and S. Magonov2 1 Add to Reading List Source URL: www.ntmdt.com Language: English - Date: 2015-01-20 05:45:42 Chemistry Atomic force microscopy Microscopy Microscope Deflection Vibrational analysis with scanning probe microscopy Piezoresponse force microscopy Scanning probe microscopy Science Scientific method

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